Standard

NEK IEC 60749-7:2002

Apr 2002 Withdrawn

Note: This standard has a new edition: NEK IEC 60749-7:2011

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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases Withdrawn NEK IEC 60749-7:2002/COR1:2003 Corrigendum from Publication date: Aug 2003 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. The contents of the corrigendum of August 2003 have been included in this copy.

Document information

Standard from NEK
Published: 9 April 2002
Withdrawn: 17 June 2011
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-7:2011
Replaced by: NEK IEC 60749-21:2004
Replaced by: NEK IEC 60749-21:2004
Replaced by: NEK IEC 60749-24:2004
Replaced by: NEK IEC 60749-24:2004
Replaced by: NEK IEC 60749-14:2003
Replaced by: NEK IEC 60749-25:2003
Replaced by: NEK IEC 60749-36:2003
Replaced by: NEK IEC 60749-19:2003
Replaced by: NEK IEC 60749-15:2003
Replaced by: NEK IEC 60749-5:2003
Replaced by: NEK IEC 60749-20:2002
Replaced by: NEK IEC 60749-22:2002
Replaced by: NEK IEC 60749-32:2002
Replaced by: NEK IEC 60749-1:2002
Replaced by: NEK IEC 60749-8:2002
Replaced by: NEK IEC 60749-31:2002
Replaced by: NEK IEC 60749-12:2002
Replaced by: NEK IEC 60749-4:2002
Replaced by: NEK IEC 60749-6:2002
Replaced by: NEK IEC 60749-13:2002
Replaced by: NEK IEC 60749-9:2002
Replaced by: NEK IEC 60749-11:2002
Replaced by: NEK IEC 60749-2:2002
Replaces: NEK IEC 60749:1996+A1:2000+A2:2001 CSV
Replaced by: NEK IEC 60749-10:2002
Replaced by: NEK IEC 60749-3:2002
Replaces: NEK IEC PAS 62191:2000
Replaces: NEK IEC PAS 62190:2000
Replaces: NEK IEC PAS 62207:2000
Replaces: NEK IEC 60749:1996
Adopted from: IEC 60749-7:2002

NEK IEC 60749-7:2002

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NEK IEC 60749-7:2011