Standard

NEK IEC 60749-12:2002

Apr 2002 Withdrawn

Note: This standard has a new edition: NEK IEC 60749-12:2017

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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency Withdrawn NEK IEC 60749-12:2002/COR1:2003 Corrigendum from Publication date: Aug 2003 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Document information

Standard from NEK
Published: 30 April 2002
Withdrawn: 5 June 2018
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60794-1-401:2021
Replaced by: NEK IEC 60794-1-401:2021
Replaced by: NEK IEC 60749-12:2017
Replaces: NEK IEC 60749:1996+A1:2000+A2:2001 CSV
Replaces: NEK IEC 60749-7:2002
Replaces: NEK IEC PAS 62187:2000
Replaces: NEK IEC 60749:1996
Adopted from: IEC 60749-12:2002

NEK IEC 60749-12:2002

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NEK IEC 60749-12:2017