Standard

NEK IEC PAS 62191:2000

Withdrawn

Corrigendums and amendments are bought separately.

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Abstract

Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 1.0
  • Version: 1
  • Document type: PAS
  • Pages
  • ICS 31.080.01
  • National Committee TC 47

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