Standard

NEK IEC 60749-5:2003

Withdrawn

Note: This standard has a new edition: NEK IEC 60749-5:2023

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Abstract

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • Pages
  • ICS 31.080.01
  • National Committee NEK/NK47

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