Standard

NEK IEC 60749-4:2002

Apr 2002 Withdrawn

Note: This standard has a new edition: NEK IEC 60749-4:2017

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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) Withdrawn NEK IEC 60749-4:2002/COR1:2003 Corrigendum from Publication date: Aug 2003 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. The contents of the corrigendum of August 2003 have been included in this copy.

Document information

Standard from NEK
Published: 12 April 2002
Withdrawn: 3 March 2017
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-4:2017
Replaced by: NEK IEC 60749-4:2017
Replaces: NEK IEC 60749:1996+A1:2000+A2:2001 CSV
Replaces: NEK IEC 60749-7:2002
Replaces: NEK IEC PAS 62177:2000
Replaces: NEK IEC 60749:1996
Adopted from: IEC 60749-4:2002

NEK IEC 60749-4:2002

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NEK IEC 60749-4:2017

NEK IEC 60749-4:2017