Standard

NEK IEC 60749-36:2003

Feb 2003 Published

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Language English

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Abstract

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Document information

Standard from NEK
Published: 13 February 2003
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaces: NEK IEC 60749:1996+A1:2000+A2:2001 CSV
Replaces: NEK IEC 60749-7:2002
Replaces: NEK IEC 60749:1996
Adopted from: IEC 60749-36:2003

NEK IEC 60749-36:2003

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