Standard

NEK IEC 60749-31:2002

Aug 2002 Published

Preview

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 341,00 Printed and bound Delivery time: 5-10 days kr 426,00

There are no extended editions available for this standard

Open product
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced) Published NEK IEC 60749-31:2002/COR1:2003 Corrigendum from Publication date: Aug 2003 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.

Document information

Standard from NEK
Published: 30 August 2002
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaces: NEK IEC 60749:1996+A1:2000+A2:2001 CSV
Replaces: NEK IEC 60749-7:2002
Replaces: NEK IEC 60749:1996
Adopted from: IEC 60749-31:2002

NEK IEC 60749-31:2002

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer