Standard

NEK IEC 60749-11:2002

Apr 2002 Published

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Language English

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Abstract

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.

Document information

Standard from NEK
Published: 12 April 2002
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaces: NEK IEC 60749:1996+A1:2000+A2:2001 CSV
Replaces: NEK IEC 60749-7:2002
Replaces: NEK IEC PAS 62185:2000
Replaces: NEK IEC 60749:1996
Adopted from: IEC 60749-11:2002

NEK IEC 60749-11:2002

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