Standard

NEK IEC 60749-8:2002

Published
Preview Preview is not available

Corrigendums and amendments are bought separately.

Language
Services

Abstract

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • Pages
  • ICS 31.080.01
  • National Committee NEK/NK47

Product Relations