Standard

NEK IEC 60749-13:2002

Apr 2002 Withdrawn

Note: This standard has a new edition: NEK IEC 60749-13:2018

Preview External link

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 341,00 Printed and bound Delivery time: 5-10 days kr 426,00

There are no extended editions available for this standard

Open product
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere Withdrawn NEK IEC 60749-13:2002/COR1:2003 Corrigendum from Publication date: Aug 2003 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Document information

Standard from NEK
Published: 12 April 2002
Withdrawn: 4 June 2018
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-13:2018
Replaces: NEK IEC 60749:1996+A1:2000+A2:2001 CSV
Replaces: NEK IEC 60749-7:2002
Replaces: NEK IEC PAS 62183:2000
Replaces: NEK IEC 60749:1996
Adopted from: IEC 60749-13:2002

NEK IEC 60749-13:2002

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

NEK IEC 60749-13:2018