Standard

NEK IEC 60749-9:2002

Withdrawn

Note: This standard has a new edition: NEK IEC 60749-9:2017

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Corrigendums and amendments are bought separately.

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Abstract

Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • Pages
  • ICS 31.080.01
  • National Committee NEK/NK47

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