Standard

NS-EN ISO 12179:2022

Feb 2022 Published

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Abstract

This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards. Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.

Document information

Standard from SN
Published: 3 February 2022
Edition: 2022-01
Version: 1
Document type: NAT
ISBN:

ICS 17.040.30
National Committee CEN/TC 290

Product Relations

Refers: ISO/IEC Guide 98-3:2008
Refers: ISO/IEC Guide 99:2007
Replaces: NS-EN ISO 12179:2000
Adopted from: EN ISO 12179:2022 , 0

Product life cycle

Previous product

Withdrawn

NS-EN ISO 12179:2000

Withdrawn

NS-EN ISO 12179:2000/AC:2008
Current product

Published

NS-EN ISO 12179:2022

NS-EN ISO 12179:2022

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