Standard

NS-EN ISO 12179:2000

Withdrawn

Note: This standard has a new edition: NS-EN ISO 12179:2022

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Abstract

This International Standard applies to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is to be carried out with the aid of measurement standards.Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.

Document information

  • Standard from SN
  • Published:
  • Withdrawn:
  • Edition: 2000-03
  • Version: 1
  • Document type: NAT
  • ICS 17.040.30
  • National Committee CEN/TC 290

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