Standard

NS-EN ISO 5436-1:2000

Aug 2000 Published

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Abstract

This part of ISO 5436 specifies the characteristics of material measures used as measurement standards (etalons) for the calibration of metrological characteristics of instruments for the measurement of surface texture by the profile method as defined in ISO 3274.

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Standard from SN
Published: 8 August 2000
Edition: 1
Version: 1
Document type: NAT
ISBN:

ICS 17.040.30
National Committee CEN/TC 290

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Referred by: NS-EN ISO 12179:2022
Adopted from: EN ISO 5436-1:2000 , 0

NS-EN ISO 5436-1:2000

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Abstract

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