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NS-EN ISO 16526-1:2020

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Abstract

ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system. This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.

Document information

  • Standard from SN
  • Published:
  • Edition: 2020-03
  • Version: 1
  • Document type: NAT
  • ICS 19.100
  • National Committee SN/K 58

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