Standard

NS-EN 12544-2:2000

Jun 2000 Withdrawn

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Language English

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Abstract

This standard specifies a constancy check of a X-ray system where mainly the X-ray voltage is checked and also the tube current and the constitution of the target which can be changing due to ageing of the tube. The thick filter method is based on a measurement of the dose rate behind a defined thick filter using defined distances between the X-ray tube, the filter and the measuring device. This method is very sensitive to changes of the voltage, but it does not provide an absolute value for the X-ray tube voltage.

Document information

Standard from SN
Published: 13 June 2000
Withdrawn: 1 April 2020
Edition: 2000-02
Version: 1
Document type: NAT
ISBN:

ICS 19.100
National Committee SN/K 58

Product Relations

Replaced by: NS-EN ISO 16526-1:2020
Replaced by: NS-EN ISO 16526-2:2020
Adopted from: EN 12544-2:2000 , 0

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Current product

Withdrawn

NS-EN 12544-2:2000
Replaced by

Published

NS-EN ISO 16526-1:2020

Published

NS-EN ISO 16526-2:2020

NS-EN 12544-2:2000

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Abstract

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Abstract

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