Standard

NS-EN 12544-1:1999

Mar 2000 Withdrawn

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Language English

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Abstract

This European standard specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system. This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.

Document information

Standard from SN
Published: 17 March 2000
Withdrawn: 1 April 2020
Edition: 1999-09
Version: 1
Document type: NAT
ISBN:

ICS 19.100
National Committee SN/K 58

Product Relations

Replaced by: NS-EN ISO 16526-1:2020
Adopted from: EN 12544-1:1999 , 0

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Current product

Withdrawn

NS-EN 12544-1:1999
Replaced by

Published

NS-EN ISO 16526-1:2020

NS-EN 12544-1:1999

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Abstract

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