Standard

NS-EN ISO 10939:2007

Jun 2007 Withdrawn

Note: This standard has a new edition: NS-EN ISO 10939:2017

Corrigendums and amendments are bought separately.

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Abstract

This International Standard, together with ISO 15004-1 and ISO 15004-2, specifies requirements and test methods for slit-lamp microscopes to provide slit illumination and observation under magnification of the eye and its adnexa. This International Standard is not applicable to microscope accessories, e.g. photographic equipment and lasers. This International Standard takes precedence over ISO 15004-1 and ISO 15004-2, if differences exist.

Document information

Standard from SN
Published: 1 June 2007
Withdrawn: 1 October 2017
Edition: 2
Version: 1
Document type: NAT
ISBN:

ICS 11.040.70
National Committee CEN/TC 170

Product Relations

Refers: IEC 60601-1:2005+AMD1:2012+AMD2:2020 CSV
Replaced by: NS-EN ISO 10939:2017
Refers: IEC 60601-1:2005+AMD1:2012 CSV
Refers: IEC 60601-1:2005 ED3
Replaces: NS-EN ISO 10939:1998
Adopted from: EN ISO 10939:2007 , 0

Product life cycle

Previous product

Withdrawn

NS-EN ISO 10939:1998
Current product

Withdrawn

NS-EN ISO 10939:2007
Replaced by

Published

NS-EN ISO 10939:2017

NS-EN ISO 10939:2007

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NS-EN ISO 10939:2017