Standard

NS-EN ISO 10939:2017

Oct 2017 Published

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Abstract

ISO 10939:2017, together with ISO 15004-1 and ISO 15004-2, specifies requirements and test methods for slit-lamp microscopes to provide slit illumination and observation under magnification of the eye and its adnexa. ISO 10939:2017 is not applicable to microscope accessories, e.g. photographic equipment and lasers. ISO 10939:2017 takes precedence over ISO 15004-1 and ISO 15004-2, if differences exist.

Document information

Standard from SN
Published: 1 October 2017
Edition: 1
Version: 1
Document type: NAT
ISBN:

ICS 11.040.70
National Committee CEN/TC 170

Product Relations

Refers: IEC 60601-1:2005+AMD1:2012+AMD2:2020 CSV
Refers: IEC 60601-1:2005+AMD1:2012 CSV
Replaces: NS-EN ISO 10939:2007
Refers: IEC 60601-1:2005 ED3
Adopted from: EN ISO 10939:2017 , 0

Product life cycle

Previous product

Withdrawn

NS-EN ISO 10939:2007
Current product

Published

NS-EN ISO 10939:2017

NS-EN ISO 10939:2017

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