Standard

NEK IEC 61163-1:2006

Published

Corrigendums and amendments are bought separately.

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Abstract

This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.

Document information

  • Standard from NEK
  • Published:
  • Edition: 2.0
  • Version: 1
  • Document type: NAT
  • Pages
  • ICS 03.120.01
  • ICS 03.120.30
  • ICS 21.020
  • National Committee NEK/NK56

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