Standard

NEK IEC 61163-1:1995

Aug 1995 Withdrawn

Note: This standard has a new edition: NEK IEC 61163-1:2006

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Corrigendum 1 - Reliability stress screening - Part 1: Repairable items manufactured in lots Withdrawn NEK IEC 61163-1:1995/COR1:1999 Corrigendum from Publication date: Dec 1999 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.

Document information

Standard from NEK
Published: 14 August 1995
Withdrawn: 26 June 2006
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 03.120.01
ICS 03.120.30
ICS 21.020
National Committee TC 56

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Replaced by: NEK IEC 61163-1:2006
Adopted from: IEC 61163-1:1995

NEK IEC 61163-1:1995

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NEK IEC 61163-1:2006