Standard

NEK IEC 60749-17:2003

Feb 2003 Withdrawn

Note: This standard has a new edition: NEK IEC 60749-17:2019

Corrigendums and amendments are bought separately.

Language English

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Abstract

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Document information

Standard from NEK
Published: 20 February 2003
Withdrawn: 28 March 2019
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-17:2019
Adopted from: IEC 60384-17:1987 ED1
Adopted from: IEC 60749-17:2003

NEK IEC 60749-17:2003

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NEK IEC 60749-17:2019