Standard

NEK IEC 60749-17:2019

Mar 2019 Published

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Language English

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Abstract

IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition: updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose; addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.

Document information

Standard from NEK
Published: 28 March 2019
Edition: 2.0
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaces: NEK IEC 60749-17:2003
Adopted from: IEC 60749-17:2019

NEK IEC 60749-17:2019

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