Standard

NEK IEC 60749-16:2003

Published

Corrigenda and amendments are bought separately.

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Abstract

Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • ICS 31.080.01
  • National Committee NEK/NK47

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