Standard

NEK IEC PAS 62171:2000

Aug 2000 Withdrawn

Corrigenda and amendments are bought separately.

Language English

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Abstract

Aims at disseminating and sharing the relevant information on PIND testing to all interested parties. The concepts and materials presented here primarily deal with most of the cause factors that affect the "Measurement Variability" pertinent to PIND and how to control them.

Document information

Standard from NEK
Published: 22 August 2000
Withdrawn: 18 August 2009
Edition: 1.0
Version: 1
Document type: PAS
ISBN:

ICS 31.080.01
National Committee TC 47

Product Relations

Adopted from: IEC TR 61282-13:2014 ED1
Replaced by: NEK IEC 60749-16:2003
Adopted from: IEC PAS 62171:2000

NEK IEC PAS 62171:2000

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Abstract

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Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

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Version history Related corrigendum and amendments (0)

Abstract

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