Standard

IEC TS 62396-2:2008 ED1

Aug 2008 Replaced

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Language English

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Abstract

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Document information

Standard from IEC
Published: 19 August 2008
Withdrawn: 27 September 2012
Edition: 1
Version: 1
Document type: TS
Pages
ISBN: 2831899583

ICS 03.100.50
ICS 31.020
ICS 49.060
ISO TC TC 107

Product Relations

Revised by: IEC 62396-2:2017 ED2
Replaced by: IEC 62396-2:2012 ED1
Replaces: IEC PAS 62396-2:2007 ED1

IEC TS 62396-2:2008 ED1

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