Standard

IEC PAS 62396-2:2007 ED1

Sep 2007 Replaced

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Language English

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Abstract

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Document information

Standard from IEC
Published: 18 September 2007
Withdrawn: 19 August 2008
Edition: 1
Version: 1
Document type: PAS
Pages
ISBN: 2831892023

ICS 03.100.50
ICS 31.020
ICS 49.060
ISO TC TC 107

Product Relations

Revised by: IEC 62396-2:2017 ED2
Replaced by: IEC TS 62396-2:2008 ED1

IEC PAS 62396-2:2007 ED1

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Abstract

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Abstract

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Product Relations

Product life cycle