Standard

IEC 61280-2-2:2008 ED3

Mar 2008 Revised

Note: This standard has a new edition: IEC 61280-2-2:2012 ED4

Corrigendums and amendments are bought separately.

Language English/French

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Abstract

This part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask. This edition includes the following significant technical changes with respect to the previous edition: - the necessity of DC coupling for extinction ratio measurement is clarified; - the definition of extinction ratio has been revised to better harmonize with ITU-T; and - the definition of OMA has been clarified.

Document information

Standard from IEC
Published: 11 March 2008
Withdrawn: 25 October 2012
Edition: 3
Version: 1
Document type: IS
Pages
ISBN: 2831896371

ICS 33.180.01
ISO TC TC 86/SC 86C

Product Relations

Revised by: IEC 61280-2-2:2012 ED4
Revises: IEC 61280-2-2:2005 ED2

IEC 61280-2-2:2008 ED3

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IEC 61280-2-2:2012 ED4