Standard

IEC 61280-2-2:2005 ED2

Apr 2005 Revised

Note: This standard has a new edition: IEC 61280-2-2:2012 ED4

Corrigendums and amendments are bought separately.

Language English/French

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Abstract

Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.

Document information

Standard from IEC
Published: 27 April 2005
Withdrawn: 11 March 2008
Edition: 2
Version: 1
Document type: IS
Pages
ISBN: 2831879353

ICS 33.180.01
ISO TC TC 86/SC 86C

Product Relations

Revised by: IEC 61280-2-2:2008 ED3
Revises: IEC 61280-2-2:1998 ED1

IEC 61280-2-2:2005 ED2

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IEC 61280-2-2:2012 ED4

IEC 61280-2-2:2008 ED3