Standard

IEC 60749-29:2003 ED1

Nov 2003 Revised

Note: This standard has a new edition: IEC 60749-29:2011 ED2

Corrigendums and amendments are bought separately.

Language English/French

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Abstract

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.

Document information

Standard from IEC
Published: 4 November 2003
Withdrawn: 7 April 2011
Edition: 1
Version: 1
Document type: IS
Pages
ISBN: 2831872413

ICS 31.080.01
ISO TC TC 47

Product Relations

Revised by: IEC 60749-29:2011 ED2
Replaces: IEC PAS 62181:2000 ED1

Product life cycle

Previous product

Replaced

IEC PAS 62181:2000 ED1
Current product

Revised

IEC 60749-29:2003 ED1
Stage 99.60
Revised by

Published

IEC 60749-29:2011 ED2

IEC 60749-29:2003 ED1

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IEC 60749-29:2011 ED2