Standard

IEC PAS 62181:2000 ED1

Jul 2000 Replaced

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Language English

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Abstract

Establishes a method for determining IC latch-up characteristics and to define latch-up failure criteria. Applicable to NMOS, CMOS, bipolar, and all variations and combinations of these technologies.

Document information

Standard from IEC
Published: 21 July 2000
Withdrawn: 4 November 2003
Edition: 1
Version: 1
Document type: PAS
Pages
ISBN: 2831853540

ISO TC TC 47

Product Relations

Replaced by: IEC 60749-29:2003 ED1

IEC PAS 62181:2000 ED1

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Abstract

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Abstract

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