Standard

NS-EN ISO 9220:1994

Tilbaketrukket

Merknad: Denne standarden har en ny utgave: NS-EN ISO 9220:2022

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Omfang

Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

Dokumentinformasjon

  • Standard fra SN
  • Publisert:
  • Tilbaketrukket:
  • Utgave: 1994-10
  • Versjon: 1
  • Varetype: NAT
  • ICS 17.040.20
  • ICS 25.220.40
  • National Committee SN/K 51

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