Standard

NS-EN ISO 9220:1994

Mar 1995 Withdrawn

Note: This standard has a new edition: NS-EN ISO 9220:2022

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Abstract

Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

Document information

Standard from SN
Published: 7 March 1995
Withdrawn: 2 May 2022
Edition: 1994-10
Version: 1
Document type: NAT
ISBN:

ICS 17.040.20
ICS 25.220.40
National Committee SN/K 51

Product Relations

Replaced by: NS-EN ISO 9220:2022
Adopted from: EN ISO 9220:1994 , 0

Product life cycle

Current product

Withdrawn

NS-EN ISO 9220:1994
Replaced by

Published

NS-EN ISO 9220:2022

Draft

prNS-EN ISO 9220:2021

NS-EN ISO 9220:1994

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NS-EN ISO 9220:2022