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NEK IEC PAS 62191:2000

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Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.

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  • Standard fra NEK
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  • Utgave: 1.0
  • Versjon: 1
  • Varetype: PAS
  • Products.Specs.pages
  • ICS 31.080.01
  • National Committee TC 47

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