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NEK IEC 61967-8:2011

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Merknad: Denne standarden har en ny utgave: NEK IEC 61967-8:2023

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IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This publication is to be read in conjunction with IEC 61967-1:2002.

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  • Products.Specs.pages
  • ICS 31.200
  • National Committee NEK/NK47

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