Standard

NEK IEC 61967-8:2011

Aug 2011 Withdrawn

Note: This standard has a new edition: NEK IEC 61967-8:2023

Corrigendums and amendments are bought separately.

Language English

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Abstract

IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This publication is to be read in conjunction with IEC 61967-1:2002.

Document information

Standard from NEK
Published: 11 August 2011
Withdrawn: 3 May 2023
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.200
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 61967-8:2023
Adopted from: IEC 61967-8:2011 ED1 , 0
Adopted from: IEC 61967-8:2011

NEK IEC 61967-8:2011

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NEK IEC 61967-8:2023