Standard

NEK IEC TS 62396-5:2008

Aug 2008 Withdrawn

Corrigendums and amendments are bought separately.

Language English

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Abstract

IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).

Document information

Standard from NEK
Published: 19 August 2008
Withdrawn: 22 August 2014
Edition: 1.0
Version: 1
Document type: TS
ISBN:

ICS 03.100.50
ICS 31.020
ICS 49.060
National Committee NEK/NK107

Product Relations

Replaced by: NEK IEC 62396-5:2014
Replaces: NEK IEC PAS 62396-5:2007
Adopted from: IEC TS 62396-5:2008

NEK IEC TS 62396-5:2008

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