Standard

NEK IEC PAS 62396-5:2007

Sept 2007 Withdrawn

Corrigendums and amendments are bought separately.

Language English

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Abstract

Provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset in microelectronics.

Document information

Standard from NEK
Published: 18 September 2007
Withdrawn: 19 August 2008
Edition: 1.0
Version: 1
Document type: PAS
ISBN:

ICS 03.100.50
ICS 31.020
ICS 49.060
National Committee TC 107

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Replaced by: NEK IEC TS 62396-5:2008
Adopted from: IEC PAS 62396-5:2007

NEK IEC PAS 62396-5:2007

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Abstract

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Benefits of our business solution:

Contact us today for a non-binding offer

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Abstract

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