Consolidated

NEK IEC 61967-4:2002+A1:2006 CSV

Jul 2006 Withdrawn

Note: This standard has a new edition: NEK IEC 61967-4:2021

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Language English

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Abstract

Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods. The contents of the corrigendum 1 of June 2017 have been included in this copy.This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.

Document information

Consolidated from NEK
Published: 27 July 2006
Withdrawn: 16 March 2021
Edition: 1.1
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.200
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 61967-4:2021
Merges: NEK IEC TR 61967-4-1:2005
Merges: NEK IEC 61967-4:2002
Adopted from: IEC 61967-4:2002+AMD1:2006 CSV

NEK IEC 61967-4:2002+A1:2006 CSV

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NEK IEC 61967-4:2021