Standard

NEK IEC 61967-4:2002

Apr 2002 Withdrawn

Note: This standard has a new edition: NEK IEC 61967-4:2021

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Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 Ω/150 Ω direct coupling method Withdrawn NEK IEC 61967-4:2002/COR1:2017 Corrigendum from Publication date: Jun 2017 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound
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Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method Withdrawn NEK IEC 61967-4:2002/A1:2006 Amendment from Publication date: Feb 2006 Version: 1 Pages: 20 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements. The contents of the corrigendum 1 of June 2017 have been included in this copy.

Document information

Standard from NEK
Published: 30 April 2002
Withdrawn: 16 March 2021
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.200
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 61967-4:2021
Merged into: NEK IEC 61967-4:2002+A1:2006 CSV
Adopted from: IEC 60904-3:1989 ED1

NEK IEC 61967-4:2002

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NEK IEC 61967-4:2021