Standard

NEK IEC 61788-15:2011

Oct 2011 Published

Note: This standard has a new edition: NEK IEC 61788-15:2026

Corrigendums and amendments are bought separately.

Language English

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Abstract

IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.

Document information

Standard from NEK
Published: 24 October 2011
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 17.220.20
ICS 29.050
National Committee NEK/NK90

Product Relations

Replaced by: NEK IEC 61788-15:2026
Adopted from: IEC 60851-6:1996 ED2
Adopted from: IEC 61788-15:2011

NEK IEC 61788-15:2011

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NEK IEC 61788-15:2026