Standard

NEK IEC 61280-2-2:2008

Mar 2008 Withdrawn

Note: This standard has a new edition: NEK IEC 61280-2-2:2012

Corrigendums and amendments are bought separately.

Language English

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Abstract

This part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask. This edition includes the following significant technical changes with respect to the previous edition: - the necessity of DC coupling for extinction ratio measurement is clarified; - the definition of extinction ratio has been revised to better harmonize with ITU-T; and - the definition of OMA has been clarified.

Document information

Standard from NEK
Published: 11 March 2008
Withdrawn: 25 October 2012
Edition: 3.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 33.180.01
National Committee NEK/NK86

Product Relations

Replaced by: NEK IEC 61280-2-2:2012
Replaced by: NEK IEC 61280-2-2:2012
Replaces: NEK IEC 61280-2-2:2005
Adopted from: IEC 61280-2-2:2008

NEK IEC 61280-2-2:2008

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NEK IEC 61280-2-2:2012

NEK IEC 61280-2-2:2012