Standard

NEK IEC 61280-2-2:1998

Nov 1998 Withdrawn

Note: This standard has a new edition: NEK IEC 61280-2-2:2012

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 2 374,00 Printed and bound Delivery time: 5-10 days kr 2 968,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

Describes a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.

Document information

Standard from NEK
Published: 30 November 1998
Withdrawn: 27 April 2005
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 33.180.01
National Committee NEK/NK86

Product Relations

Adopted from: IEC 60204-11:2018 RLV
Adopted from: IEC 60204-11:2018 ED2
Replaced by: NEK IEC 61280-2-2:2005

NEK IEC 61280-2-2:1998

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

NEK IEC 61280-2-2:2012

NEK IEC 61280-2-2:2012

NEK IEC 61280-2-2:2008

NEK IEC 61280-2-2:2005