Standard

NEK IEC 60749-5:2017

Apr 2017 Published

Note: This standard has a new edition: NEK IEC 60749-5:2023

Corrigendums and amendments are bought separately.

Language English

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Abstract

IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) correction of an error in an equation; b) inclusion of notes for guidance; c) clarification of the applicability of test conditions.

Document information

Standard from NEK
Published: 10 April 2017
Edition: 2.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-5:2023
Adopted from: IEC TR 60522-2:2020 ED1, 0
Replaces: NEK IEC 60749-5:2003

NEK IEC 60749-5:2017

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NEK IEC 60749-5:2023