It is currently not possible to order printed and bound versions of standards. This is due to challenges related to our printing supplier. We are working to resolve the situation and apologize for any inconvenience this may cause. For other options, contact salg@standard.no.
Standard

NEK IEC 60749-29:2011

Published
Preview

Corrigenda and amendments are bought separately.

Language
Services

Abstract

IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include: - a number of minor technical changes; - the addition of two new annexes covering the testing of special pins and temperature calculations.

Document information

  • Standard from NEK
  • Published:
  • Edition: 2.0
  • Version: 1
  • Document type: NAT
  • ICS 31.080.01
  • National Committee NEK/NK47

Product Relations