Standard

NEK IEC 60749-29:2003

Nov 2003 Withdrawn

Note: This standard has a new edition: NEK IEC 60749-29:2011

Corrigendums and amendments are bought separately.

Language English

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Abstract

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.

Document information

Standard from NEK
Published: 4 November 2003
Withdrawn: 7 April 2011
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-29:2011
Replaces: NEK IEC PAS 62181:2000
Adopted from: IEC 60749-29:2003

NEK IEC 60749-29:2003

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NEK IEC 60749-29:2011