Standard

NEK IEC 60444-11:2026

Apr 2026 Published

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Language English

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Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction Published NEK IEC 60444-11:2026 RLV Redline Publication date: Apr 2026 Language: English Services: Read Online (No printing ), Printed and bound

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

IEC 60444-11:2026 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.This edition includes the following significant technical changes with respect to the previous edition:a) key content of withdrawn IEC TR 60444-4 is reproduced as Annex A;b) some formulae in the first edition have been corrected.

Document information

Standard from NEK
Published: 26 April 2026
Edition: 2.0
Version: 1
Document type: NAT
ISBN:

ICS 31.140

Product Relations

Replaces: NEK IEC 60444-11:2010
Adopted from: IEC 60444-11:2026

NEK IEC 60444-11:2026

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