Standard

NEK IEC 60444-11:2010

Oct 2010 Withdrawn

Note: This standard has a new edition: NEK IEC 60444-11:2026

Corrigendums and amendments are bought separately.

Language English

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Abstract

IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.

Document information

Standard from NEK
Published: 7 October 2010
Withdrawn: 22 April 2026
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.140
National Committee NEK/NK49

Product Relations

Replaced by: NEK IEC 60444-11:2026
Adopted from: IEC 60268-17:1990 ED1

NEK IEC 60444-11:2010

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NEK IEC 60444-11:2026