Standard

NEK IEC 60333:1993

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Abstract

Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 3.0
  • Version: 1
  • Document type: NAT
  • Pages
  • ICS 17.240
  • National Committee TC 45

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