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Standard

NEK EN 60749-29:2003

Withdrawn

Note: This standard has a new edition: NEK EN 60749-29:2011

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Abstract

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing No Trouble Found and Electrical Overstress failures due to latch-up.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 1
  • Version: 1
  • Document type: NAT
  • ICS 31.080
  • National Committee NEK/NK47

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